Assessment of X-ray diffraction and crystal plasticity lattice strain evolutions under biaxial loading - ScienceDirect
Crystals | Free Full-Text | Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti
Powder Diffraction for industry | Diamond Light Source - - Diamond Light Source
Mode (4): Use of Line/Area Detectors
Debye-Scherrer-Verfahren – Wikipedia
Diffracting-grain identification from electron backscatter diffraction maps during residual stress measurements: a comparison be
Calculation of Debye-Scherrer diffraction patterns from highly stressed polycrystalline materials: Journal of Applied Physics: Vol 119, No 21
A02-Ⅰ|Interdisciplinary research on quantum imaging opened with 3D semiconductor detector
PDF] INFLUENCE OF IMAGE PROCESSING CONDITIONS OF DEBYE SCHERRER RING IMAGES IN X-RAY STRESS MEASUREMENT USING AN IMAGING PLATE | Semantic Scholar
Debye-Scherrer diffraction rings as recorded on the image plate for Kr... | Download Scientific Diagram
Half of the Debye-Scherrer rings showing some identified... | Download Scientific Diagram
Quarters of representative Debye–Scherrer rings obtained at 25, 475,... | Download Scientific Diagram